| Description
A new LOG mode of operation enables overall run data to be gathered together with regular periodic sets of data for further detail. Additional information may be obtained by the use of short duration profiles to enable "quasi level recorder" operation to show time history variations.
Simultaneous frequency weightings and time weightings give practical flexibility in the setup of the instrument, where specific configurations can be saved in non volatile Setup memories for repeated use. Comprehensive measurement timers allow the data to be gathered under user control and a wide range of interval times provide flexibility in data acquisition.
Once measurements have been completed, the run data can be retrieved over standard phone lines using dial up modems or suitable GSM cell phones. Data can also be transferred from the meter to an attached computer for a live system with a remote display in real-time plus data storage.
These sound level analyzers meet the following electro-acoustic standards.
BS EN 60651: 1994, BS EN 60804: 1994, ANSI S1.4-1983, ANSI S1.43-1997, IEC 1260: 1995, ANSI S1.11-1986. with CEL-192 or 250 1/2" microphone capsule.
They include the following time weightings: Slow, Fast and Impulse for RMS measurements plus true peak, And frequency weightings: A,C and Lin (unweighted) for RMS. Measurements plus C and Lin for the peak channel, And Amplitude weightings (Q): 4,5 and 6 for the measurement of LAVG, The display has a 128 by 192 dot LCD matrix that can show results in graphical or tabular format with back-lighting. |
Measurement Ranges
Broad band measurements are available over a 100 dB dynamic range that can be operated from both the instrument and PC in over - lapping ranges: 10-110, 20-120, 30-130 and 40-140dB.
Narrow band measurements can be made over 75 dB dynamic range only from the PC in either octave or third octave bands: 5-80, 15-90, 25-100, 35-110, 45-120, 55-130 and 65-140 dB.
Parameters Measured
Broad band measurements can be made of the following noise parameters:
L, Lpk, Leq, Lleq, Lmx, Lmn, LAE, LAVG, LDN, CNEL, Lep,d, LTm3, LTm5, 5 x LN%, Using the PC, narrow band measurements can be made of the following noise parameters in either octave or third octave bands:
L, Leq, at up to 2 spectra per second. |